Prof Dr. Felix | Crystals Award | Best Researcher Award

Prof Dr. Felix, a A.V. Shubnikov Institute of Crystallography, Federal Scientific Research Centre Crystallography and Photonics RAS, Leninskii prospekt, 59, Moscow, 119333, Russian Federation, and bInstitute of Applied Mathematics and Automation, KBSC RAS, ‘Shortanov’ Street, 89A, Nal’chik, 360000, Russian Federation.

Publication Profile

Scopus

Education

Graduating from I.V. Kurchatov’s Institute of Atomic Energy, Moscow, he obtained his Ph.D. from the A.V. Shubnikov’s Institute of Crystallography, Russian Academy of Science. Currently, he holds the prestigious position of Full Professor of Physics and Condensed Matter at the A.V. Shubnikov’s Institute of Crystallography, Russian Academy of Science, Moscow.

Research Focus

Professor Felix N. Chukhovskii’s research primarily revolves around advancing X-ray diffraction tomography techniques 🧪. He focuses on developing innovative methods for crystallographic analysis, particularly in studying crystals with nanosized defects and point defect displacement fields. Prof. Chukhovskii’s work encompasses denoising of Poisson-noise statistics in 2D image patterns, tackling fractional Takagi–Taupin equations, and exploring novel theoretical approaches like the Green function formalism for GISAXS issues. His dedication to refining X-ray diffraction methods promises to deepen our understanding of crystal structures and materials properties, paving the way for groundbreaking discoveries in materials science and beyond.

Publication Top Notes

• Towards the Theory of X-ray Diffraction Tomography of Crystals with Nanosized Defects by Grigorev et al., published in the Journal of Surface Investigation in 2024 📑.
• Comprehensive Recovery of Point Defect Displacement Field Function in Crystals by Computer X-ray Diffraction Microtomography by Chukhovskii et al., published in Crystals in 2024 📊.
• Denoising of the Poisson-Noise Statistics 2D Image Patterns in the Computer X-ray Diffraction Tomography by Chukhovskii et al., published in Crystals in 2023 🖥️.
• Towards to solution of the fractional Takagi–Taupin equations. The Green function method by Mamchuev and Chukhovskii, published in Fractional Calculus and Applied Analysis in 2023 📈.
• Novel theoretical approach to the GISAXS issue: the Green function formalism using the q-Eigenwaves propagating through a twofold rough-surfaced medium by Chukhovskii and Roshchin, published in Scientific Reports in 2020 🌐.
• On the Theory of Reducing the Level of Statistical Noise and Filtering of 2D Images of Diffraction Tomography by Bondarenko et al., published in Crystallography Reports in 2020 📉.
• Correcting the Characteristics of Silicon Photodiodes by Ion Implantation by Asadchikov et al., published in Semiconductors in 2020 💡.
• Lateral Inhomogeneities of Sapphire Plates Determined with the Aid of X-Ray and Probe Methods by Asadchikov et al., published in Technical Physics in 2020 🔍.
• Towards a solution of the inverse X-ray diffraction tomography challenge: Theory and iterative algorithm for recovering the 3D displacement field function of Coulomb-type point defects in a crystal by Chukhovskii et al., published in Acta Crystallographica Section A: Foundations and Advances in 2020 🔄.
• Study of Properties of Materials by Absorption and Diffraction X-Ray Microtomography by Asadchikov et al., published in Inorganic Materials in 2019 📏.